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Issue No. 03 - May-June (vol. 24)
ISSN: 0740-7475
From the EIC
Special Issue Features

Guest Editors' Introduction: IR Drop in Very Deep-Submicron Designs (HTML)

Kenneth M. Butler , Texas Instruments
Mohammad Tehranipoor , University of Connecticut
pp. 214-215

A Production IR-Drop Screen on a Chip (Abstract)

Zahi Abuhamdeh , TranSwitch
Bob Hannagan , TranSwitch
Jeff Remmers , Plexus Design Solutions
pp. 216-224

Modeling Power Supply Noise in Delay Testing (Abstract)

Paul J.A.M. van de Wiel , NXP Semiconductors
Bram Kruseman , NXP Semiconductors
Jing Wang , Texas A&M University
Duncan M. (Hank) Walker , Texas A&M University
Guido Gronthoud , NXP Semiconductors
Ananta Majhi , NXP Semiconductors
Luis Elvira Villagra , NXP Semiconductors
Xiang Lu , P.A. Semi
Stefan Eichenberger , NXP Semiconductors
pp. 226-234

Power Supply Noise in SoCs: Metrics, Management, and Measurement (Abstract)

Xiongfei Meng , University of British Columbia
Karim Arabi , PMC-Sierra
Resve Saleh , University of British Columbia
pp. 236-244

Power Grid Physics and Implications for CAD (Abstract)

Eli Chiprout , Intel
David Blaauw , University of Michigan, Ann Arbor
Sanjay Pant , University of Michigan, Ann Arbor
pp. 246-254

Analysis of Power Supply Noise in the Presence of Process Variations (Abstract)

Sarma Vrudhula , Arizona State University
Praveen Ghanta , Arizona State University
pp. 256-266

Scan-Based Tests with Low Switching Activity (Abstract)

Xijiang Lin , Mentor Graphics
Irith Pomeranz , Purdue University
Janusz Rajski , Mentor Graphics
Sudhakar M. Reddy , University of Iowa
Santiago Remersaro , University of Iowa
pp. 268-275

Power Droop Testing (Abstract)

Ilia Polian , Albert-Ludwigs University of Freiburg
Alejandro Czutro , Albert-Ludwigs University of Freiburg
Bernd Becker , Albert-Ludwigs University of Freiburg
Sandip Kundu , University of Massachusetts, Amherst
pp. 276-284

Everything but the kitchen sink (HTML)

Grant Martin , Tensilica
pp. 286-287

CEDA Currents (Abstract)

pp. 288-289

DATC Newsletter (HTML)

pp. 291

TTTC Newsletter (HTML)

pp. 292

Conference Reports (Abstract)

pp. 294-295
The Last Byte

The case for power with test (Abstract)

T.M. Mak , Intel
pp. 296
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