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Issue No. 03 - May-June (2007 vol. 24)
ISSN: 0740-7475
pp: 294-295
1. Latin-American Test Workshop--Victor Champac (National Institute for Astrophysics, Optics, and Electronics)--The 8th IEEE Latin-American Test Workshop was held 11-14 March 2007 in Cuzco, Peru. The technical program included regular papers, embedded tutorials, a panel session, and dedicated tutorials. The first day of the workshop was dedicated to the IEEE Test Technology Educational Program (TTEP). A meeting was also held at LATW for those involved in the ALFA Project. 2. Design and Diagnostics of Electronic Circuits and Systems--Patrick Girard (LIRMM), Andrzej Krasnewski (Warsaw University of Technology), Elena Gramatova (Slovak Academy of Sciences), and Adam Pawlak (Silesian University of Technology)--DDECS 2007 was held 11-13 April in Krakow, Poland. The technical program spanned three days of single-track sessions supported by three excellent keynote speeches. The program also included sponsor presentations, as well as the first annual presentation of the Jan Hlavicka Memorial award for outstanding paper by an East European author. In addition, DDECS was once again accompanied by the Challenges in Collaborative Engineering Workshop.
LATW, DDECS, test, design, TTEP, diagnostics, Latin-American, electronic circuits and systems, Jan Havlicka Memorial award

"Conference Reports," in IEEE Design & Test of Computers, vol. 24, no. , pp. 294-295, 2007.
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