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Test Technology TC Newsletter

Pages: p. 292


13th IEEE International On-Line Testing Symposium (IOLTS 07)

8-11 July 2007

Hersonissos-Heraklion, Crete, Greece

Issues related to online testing are increasingly important in modern electronics systems. In particular, the huge complexity of electronic systems has increased the demand for reliability in several application domains, as well as for low-cost products. There is a corresponding demand for cost-effective online testing techniques. These demands have increased dramatically with the introduction of very deep-submicron and nanometer technologies, which adversely impact noise margins and process parameter variations and which make integrating online testing and fault tolerance mandatory in many modern ICs. IOLTS is an established forum for presenting novel ideas and experimental data on these areas. The symposium also emphasizes online testing in the continuous operation of large applications such as wired, cellular, and satellite telecommunication, as well as secure chips.

5th IEEE East-West Design & Test International Symposium (EWDTS 07)

7-10 September 2007

Yerevan, Armenia

The main goal of the 5th IEEE East-West Design & Test Symposium is for scientific schools and experts from Eastern and Western Europe, as well as the US and other parts of the world, to share their experience in the design, design automation, and test of electronic systems. The symposium especially aims to attract scientists from areas around the Black Sea, including Ukraine, Russia, Bulgaria, Romania, Georgia, Armenia, Turkey, Belarus, the Baltic states, and the countries of Central Asia.

22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 07)

26-28 September 2007


DFT provides an annual forum for presentations in the field of defect and fault tolerance in VLSI systems, including emerging technologies. One of the unique features of this symposium is that it combines new academic research with state-of-the-art industry data—necessary ingredients for significant advances in this field. Topics for discussion at this year's symposium include all aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation.

IEEE 16th Asian Test Symposium (ATS 07)

9-11 October 2007


The Asian Test Symposium provides an annual international forum for engineers and researchers from around the world, especially Asia, to present and discuss various aspects of system, board, and device testing. This year's focus is on test methods for nanometer technologies.


I would appreciate input and suggestions about the newsletter from the test community. Please forward your ideas, contributions, and information on awards, conferences, and workshops to Bruce C. Kim, Dept. of Electrical and Computer Engineering, Univ. of Alabama, 317 Houser Hall, Tuscaloosa, AL 35487-0286;

Bruce C. Kim

Editor, TTTC Newsletter


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