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Issue No. 03 - May-June (2007 vol. 24)
ISSN: 0740-7475
pp: 226-234
Paul J.A.M. van de Wiel , NXP Semiconductors
Bram Kruseman , NXP Semiconductors
Jing Wang , Texas A&M University
Duncan M. (Hank) Walker , Texas A&M University
Guido Gronthoud , NXP Semiconductors
Ananta Majhi , NXP Semiconductors
Luis Elvira Villagra , NXP Semiconductors
Xiang Lu , P.A. Semi
Stefan Eichenberger , NXP Semiconductors
ABSTRACT
Excessive power supply noise can affect path delay in ICs. Silicon results show that filling of don't-care bits in test patterns can cause as much as 15% delay variation. Such extra delay may cause overkill during delay test. This article describes two types of low-cost noise models, compares them in model accuracy and application, and provides directions for model improvement. Excessive noise may come from compaction or filling during delay test generation. Experiments show how noise varies with different filling approaches, and how compaction is affected when the noise level for compacted tests is constrained.
INDEX TERMS
delay test, power supply noise model, compaction, filling
CITATION
Paul J.A.M. van de Wiel, Bram Kruseman, Jing Wang, Duncan M. (Hank) Walker, Guido Gronthoud, Ananta Majhi, Luis Elvira Villagra, Xiang Lu, Stefan Eichenberger, "Modeling Power Supply Noise in Delay Testing", IEEE Design & Test of Computers, vol. 24, no. , pp. 226-234, May-June 2007, doi:10.1109/MDT.2007.76
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