• IR-drop effects on path delay test,
• IR-drop effects during faster-than-at-speed test,
• power management during launch and capture of at-speed test,
• fast and accurate IR-drop and PSN measurement,
• pattern generation for worst-case IR-drop and PSN,
• IR-drop and PSN-aware timing verification, and
• library characterization for IR-drop-aware performance verification.
Mohammad Tehranipoor is an assistant professor in the Department of Electrical and Computer Engineering at the University of Connecticut. His research interests include CAD and test for nanometer technology designs, DFT, at-speed test, and secure design. Tehranipoor has a BSc from Amirkabir University of Technology, an MSc from the University of Tehran, and a PhD from the University of Texas at Dallas, all in electrical engineering. He is a member of the IEEE Computer Society, the ACM, and ACM SIGDA.
Kenneth M. Butler is a TI Fellow at Texas Instruments in Dallas, Texas. His research interests include outlier techniques for quality and reliability, and test-data-driven decision-making. Butler has a BS from Oklahoma State University, and an MS and a PhD from the University of Texas at Austin, all in electrical engineering. He is a senior member of the IEEE and a member of the ACM.