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Issue No. 02 - March-April (vol. 24)
ISSN: 0740-7475
From the EIC
Advances in Functional Validation through Hybrid Techniques

Guest Editors' Introduction: Attacking Functional Verification through Hybrid Techniques (HTML)

Li-C. Wang , University of California, Santa Barbara
Magdy S. Abadir , Freescale Semiconductor
Jayanta Bhadra , Freescale Semiconductor
pp. 110-111

A Survey of Hybrid Techniques for Functional Verification (Abstract)

Jayanta Bhadra , Freescale Semiconductor
Magdy S. Abadir , Freescale Semiconductor
Sandip Ray , University of Texas at Austin
Li-C. Wang , University of California, Santa Barbara
pp. 112-122

Hybrid Verification of Protocol Bridges (Abstract)

Raj S. Mitra , Texas Instruments
Praveen Tiwari , Texas Instruments
pp. 124-131

Combining Theorem Proving with Model Checking through Predicate Abstraction (Abstract)

Sandip Ray , University of Texas at Austin
Rob Sumners , Advanced Micro Devices
pp. 132-139

Hybrid, Incremental Assertion-Based Verification for TLM Design Flows (Abstract)

Andrea Fedeli , STMicroelectronics
Graziano Pravadelli , University of Verona
Franco Fummi , University of Verona
Nicola Bombieri , University of Verona
pp. 140-152

Hybrid Approach to Faster Functional Verification with Full Visibility (Abstract)

Dong-Jung Lu , AU Optronics
Wei-Hsiang Cheng , National Central University
Chien-Nan Jimmy Liu , National Central University
Chin-Lung Chuang , National Central University
pp. 154-162
Built-in Self-Repair

Economic Aspects of Memory Built-in Self-Repair (Abstract)

Chao-Hsun Chen , National Tsing Hua University
Rei-Fu Huang , Media Tek
Cheng-Wen Wu , National Tsing Hua University
pp. 164-172

Roundtable: Envisioning the Future for Multiprocessor SoC (Abstract)

Pierre Paulin , STMicroelectronics
Masao Nakaya , Renesas Technology
Wayne Wolf , Princeton University
Deepu Talla , Texas Instruments
Ulrich Ramacher , Infineon Technologies
Markus Levy , The Multicore Association and EEMBC
pp. 174-183

A textbook with two target audiences (HTML)

Scott Davidson , Sun Microsystems
pp. 198-199

CEDA Currents (Abstract)

pp. 200-201

Conference Reports (Abstract)

C.P. Ravikumar , Texas Instruments
Jari Nurmi , Tampere University of Technology
pp. 202-203

Panel Summaries (Abstract)

pp. 204-206

DATC Newsletter (HTML)

pp. 207
The Last Byte

Losing control (Abstract)

Scott Davidson , Sun Microsystems
pp. 208
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