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Issue No. 02 - March-April (2007 vol. 24)
ISSN: 0740-7475
pp: 204-206
1. IEEE International Workshop on Design For Manufacturing & Yield, Gary Smith (Gary Smith EDA)--On 26 October, the first Workshop on Design for Manufacturing & Yield (DFM&Y) was held in conjunction with the International Test Conference. In addition to regular and invited papers, the workshop included a very interesting panel session. This panel explored DFM, DFY, and RET, both in terms of technology and as an emerging market. 2. Electronics Design Industry in the Middle East, Hazem El Tahawy (Mentor Graphics Egypt)--This panel took place on 19 November 2006 at the International Design and Test Workshop (IDT 2006) in Dubai, United Arab Emirates. The purpose was to explore the problems facing the electronics design industry in the Middle East and to make some recommendations in light of the experiences of newly industrialized countries from Northeast and Southeast Asia, as well as India. The main factors affecting the promotion of the electronics design industry in this region include motivating foreign direct investment, encouraging R&D, improving marketing, enhancing training and human development, and harnessing the finances needed to encourage capital-intensive industries.
DFM&Y, electronics design, DFM, DFY, RET, Middle East, IDT

"Panel Summaries," in IEEE Design & Test of Computers, vol. 24, no. , pp. 204-206, 2007.
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