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Issue No. 02 - March-April (2007 vol. 24)
ISSN: 0740-7475
pp: 202-203
C.P. Ravikumar , Texas Instruments
Jari Nurmi , Tampere University of Technology
ABSTRACT
1. TTTC Forum honors Melvin Breuer--at the 2006 International Test Conference, a half-day technical forum was held to honor Melvin Breuer, a pioneer in the areas of VLSI design automation and test; 2. Design flow and methodology addressed at SOC 2006--The International Symposium on System-on-Chip took place on 13-16 November 2006 in Tampere, Finland. The theme was "SoC Design Flow and Methodology." There were nine high-caliber, 45-minute invited talks, covering different approaches and application areas in SoC design.
INDEX TERMS
Melvin Breuer, ITC, SOC 2006, SoC design
CITATION

C. Ravikumar and J. Nurmi, "Conference Reports," in IEEE Design & Test of Computers, vol. 24, no. , pp. 202-203, 2007.
doi:10.1109/MDT.2007.39
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