Issue No. 02 - March-April (2007 vol. 24)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2007.31
Scott Davidson , Sun Microsystems
This is a review of VLSI Test Principles and Architectures (edited by Laung-Terng Wang, Cheng-Wen Wu, and Xiaoqing Wen), which is partly a textbook and partly a collection of survey articles on testing by top experts. The book's strengths include the practical aspects discussed, the good examples presented, and the depth of many of its chapters. The weaknesses include a lack of consistency of target audience across chapters and a lack of cohesiveness. Nearly everyone will get something out of this book, but prospective purchasers should review the topics of interest to see if the level is right for them.
VLSI, test principles, architectures, DFT
S. Davidson, "A textbook with two target audiences," in IEEE Design & Test of Computers, vol. 24, no. , pp. 198-199, 2007.