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Issue No. 06 - November/December (vol. 23)
ISSN: 0740-7475

Statistical Test Compaction Using Binary Decision Trees (Abstract)

Sounil Biswas , Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA
R.D. Blanton , Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA
pp. 452-462
From the EIC
Process Variation and Stochastic Design and Test

Guest Editors' Introduction: Process Variation and Stochastic Design and Test (HTML)

Sani Nassif , IBM Austin Research Laboratory
T.M. Mak , Intel
pp. 436-437

Testing On-Die Process Variation in Nanometer VLSI (Abstract)

Mehrdad Nourani , University of Texas at Dallas
Arun Radhakrishnan , Texas Instruments
pp. 438-451

Statistical Test Compaction Using Binary Decision Trees (Abstract)

Sounil Biswas , Carnegie Mellon University
Ronald D. (Shawn) Blanton , Carnegie Mellon University
pp. 452-462

A DFT Approach for Testing Embedded Systems Using DC Sensors (Abstract)

Soumendu Bhattacharya , Texas Instruments
Abhijit Chatterjee , Georgia Institute of Technology
pp. 464-475

ElastIC: An Adaptive Self-Healing Architecture for Unpredictable Silicon (Abstract)

David Blaauw , University of Michigan, Ann Arbor
Eric Karl , University of Michigan, Ann Arbor
Dennis Sylvester , University of Michigan, Ann Arbor
pp. 484-490
Interview
Departments

Book Reviews: NoC, NoC ... Who's there? (HTML)

Grant Martin , Tensilica
pp. 500-501

Design and test on chip for EMC (HTML)

pp. 502-503

East-West Design & Test Workshop (HTML)

Vladimir Hahanov , Kharkov National University of Radioelectronics
pp. 504-505

CEDA Currents (Abstract)

pp. 506

TTTC Newsletter (HTML)

pp. 507

DATC Newsletter (HTML)

pp. 508
IEEE Design & Test of Computers 2006 Annual Index, Volume 23
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