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Issue No. 06 - November/December (2006 vol. 23)
ISSN: 0740-7475
pp: 520
ABSTRACT
Variability and reliability will be the barriers to future technology scaling. Every discipline, from fabrication to software, needs to cooperate and make the VLSI system reliable in the presence of variability and the resulting inherent unreliability of components.
INDEX TERMS
technology scaling, VLSI designs, transistor subthreshold leakage, variability, reliability
CITATION
Shekhar Borkar, "Tackling variability and reliability challenges", IEEE Design & Test of Computers, vol. 23, no. , pp. 520, November/December 2006, doi:10.1109/MDT.2006.156
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