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4–5 December 2006
This workshop brings together researchers and practitioners from verification and test to discuss today's challenges in the processor and SoC design environments. MTV is the ideal environment for sharing joint test and verification experiences and innovative solutions.
20–24 May 2007
ETS is Europe's premier forum for presenting and discussing scientific results, emerging ideas, practical applications, hot topics, and new trends in electronic-based circuit and system testing.
Submissions deadline: 8 December 2006
11–13 April 2007
http://www.iele.polsl.pl/ ddecs2007/files/ddecs2007 -CfP.pdf
This workshop provides a forum for discussing research results and presenting practical applications in design, test, and diagnosis of microelectronic circuits and systems.
Submissions deadline: 10 January 2007
3–4 June 2007
San Diego, Calif.
This conference is dedicated to furthering undergraduate and graduate education in designing and building innovative microelectronic systems.
Submissions deadline: 15 January 2007
The 5th International Board Test Workshop took place in Fort Collins, Colorado, 13–15 September 2006. BTW 2006 brought attendees from China, Taiwan, Estonia, England, France, and the US. The workshop covered a wide range of topics, including new boundary-scan-based standards for memories, cell phones, and systems; issues with boundary scan and in-circuit testing; concurrent boundary scan testing; functional test coverage; board test economics; a university-developed boundary scan simulation tool; and an insightful perspective on the history and future of DFT. For more information, see http://www.dft.co.uk/BTW2006.
I would appreciate input and suggestions about the newsletter from the test community. Please forward your ideas, contributions, and information on awards, conferences, and workshops to Bruce C. Kim, Dept. of Electrical and Computer Engineering, Univ. of Alabama, 317 Houser Hall, Tuscaloosa, AL 35487-0286; email@example.com.
Bruce C. Kim
Editor, TTTC Newsletter