Issue No. 06 - November/December (2006 vol. 23)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.143
Fabian Vargas , PUCRS
The "Design and test on chip for EMC" panel at the 2006 EMC Europe International Symposium on Electromechanical Compatibility addressed the recent explosion of the portable-electronics market and the increasingly hostile electromagnetic environment in which these systems must operate.
electromagnetic compatibility, EMC, portable electronics, electromagnetic environment
F. Vargas, "Design and test on chip for EMC," in IEEE Design & Test of Computers, vol. 23, no. , pp. 502-503, 2006.