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Issue No. 05 - September/October (2006 vol. 23)
ISSN: 0740-7475
pp: 432
Anne Gattiker , IBM Austin Research Lab
ABSTRACT
A look at plans for the 2006 International Test Conference.
INDEX TERMS
International Test Conference
CITATION

A. Gattiker, "Getting More out of ITC," in IEEE Design & Test of Computers, vol. 23, no. , pp. 432, 2006.
doi:10.1109/MDT.2006.119
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