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27–29 September 2006
Therminic workshops are offered annually to address the essential thermal questions of microelectronic microstructures, and of electronic parts in general. This year's workshop discusses issues in thermal simulation, monitoring, and cooling.
4–6 October 2006
DFT provides an open forum for discussing defect and fault tolerance in VLSI systems, including emerging technologies. Topics include all aspects of design, manufacturing, test, reliability, and availability affected by defects during manufacturing or by faults during system operation.
24–26 October 2006
Santa Clara, Calif.
ITC is the world's premier conference on the electronic test of devices, boards, and systems. It covers the complete cycle from design verification, test, diagnosis, and failure analysis to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces and learn how academia, design-tool and equipment suppliers, designers, and test engineers address these challenges.
26–27 October 2006
Santa Clara, Calif.
To develop more appropriate fault models, designers and test engineers must have a good handle on both systematic and random defect mechanisms to support the manufacturability of ICs for defect-based test approaches. Because of increasing design complexity and process variability, the focus is shifting to such approaches. This workshop addresses these issues.
19–20 November 2006
Dubai, United Arab Emirates
This event provides a unique forum in the Middle East and Africa region for researchers and practitioners of VLSI design, test, and fault tolerance to discuss new research ideas and results. IDT will run in conjunction with the annual Innovations of IT Conference and in parallel with Global IT Exhibitions (GITEX).
4–5 December 2006
This workshop brings together researchers and practitioners from verification and test to discuss today's difficult challenges in the processor and SoC design environments. It's the ideal environment for joint test and verification experiences and innovative solutions.
I'd appreciate input and suggestions about the newsletter from the test community. Please forward your ideas, contributions, and information on awards, conferences, and workshops to Bruce C. Kim, Dept. of Electrical and Computer Engineering, Univ. of Alabama, 317 Houser Hall, Tuscaloosa, AL 35487-0286; firstname.lastname@example.org.
Bruce C. Kim
Editor, TTTC Newsletter