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Issue No. 05 - September/October (2006 vol. 23)
ISSN: 0740-7475
pp: 390-400
R.D. (Shawn) Blanton , Carnegie Mellon University
Chris Schuermyer , LSI Logic
Jeffrey E. Nelson , Carnegie Mellon University
Wojciech Maly , Carnegie Mellon University
Jason G. Brown , Carnegie Mellon University
Brady Benware , LSI Logic
Thomas Zanon , Carnegie Mellon University
Osei Poku , Carnegie Mellon University
ABSTRACT
Defect density and size distributions are difficult to characterize, especially if you have little or no access to test vehicles specifically designed for the purpose. The authors propose a new methodology for extracting that information directly from production test data on actual products.
INDEX TERMS
defect density, size distributions, product IC
CITATION
R.D. (Shawn) Blanton, Chris Schuermyer, Jeffrey E. Nelson, Wojciech Maly, Jason G. Brown, Brady Benware, Thomas Zanon, Osei Poku, "Extracting Defect Density and Size Distributions from Product ICs", IEEE Design & Test of Computers, vol. 23, no. , pp. 390-400, September/October 2006, doi:10.1109/MDT.2006.117
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