The Community for Technology Leaders
Green Image
Issue No. 05 - September/October (2006 vol. 23)
ISSN: 0740-7475
pp: 388-389
Kenneth M. Butler , Texas Instruments
This special section, along with the International Test Conference 2006, highlights the value that test adds to the electronics manufacturing business. It leads us to think about test in a whole new way.
International Test Conference, test
Kenneth M. Butler, "Guest Editor's Introduction: ITC Helps Get More Out of Test", IEEE Design & Test of Computers, vol. 23, no. , pp. 388-389, September/October 2006, doi:10.1109/MDT.2006.120
80 ms
(Ver 3.3 (11022016))