Issue No. 05 - September/October (2006 vol. 23)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.120
Kenneth M. Butler , Texas Instruments
This special section, along with the International Test Conference 2006, highlights the value that test adds to the electronics manufacturing business. It leads us to think about test in a whole new way.
International Test Conference, test
K. M. Butler, "Guest Editor's Introduction: ITC Helps Get More Out of Test," in IEEE Design & Test of Computers, vol. 23, no. , pp. 388-389, 2006.