Issue No.05 - September/October (2006 vol.23)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.135
This issue of IEEE Design & Test discusses some of the challenges of electronic system-level design and their corresponding solutions. In addition, a special section highlights the 2006 International Test Conference.
electronic system-level design, ESL
Kwang-Ting (Tim) Cheng, "The New World of ESL Design", IEEE Design & Test of Computers, vol.23, no. 5, pp. 333, September/October 2006, doi:10.1109/MDT.2006.135