Issue No. 05 - September/October (2006 vol. 23)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.135
This issue of IEEE Design & Test discusses some of the challenges of electronic system-level design and their corresponding solutions. In addition, a special section highlights the 2006 International Test Conference.
electronic system-level design, ESL
K. (. Cheng, "The New World of ESL Design," in IEEE Design & Test of Computers, vol. 23, no. , pp. 333, 2006.