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TABLE OF CONTENTS
Issue No. 04 - July/August (vol. 23)
ISSN: 0740-7475
On-Chip Testing

Sociology of Design and EDA (Abstract)

pp. 304-310
From the EIC
Conference Reports
On-Chip Testing

On-Chip Testing Techniques for RF Wireless Transceivers (Abstract)

Jose Silva-Martinez , Texas A&M University
Alberto Valdes-Garcia , IBM Research
Edgar S?nchez-Sinencio , Texas A&M University
pp. 268-277

Quiescent-Signal Analysis: A Multiple Supply Pad IDDQ Method (Abstract)

Mohammad Tehranipoor , University of Maryland, Baltimore
Abhishek Singh , University of Maryland, Baltimore
Jim Plusquellic , University of Maryland, Baltimore
Chintan Patel , University of Maryland, Baltimore
Dhruva Acharyya , University of Maryland, Baltimore
pp. 278-293

Survey of Test Vector Compression Techniques (Abstract)

Nur A. Touba , University of Texas at Austin
pp. 294-303
Departments

Book Reviews: Plumbing the Depths of Leakage (HTML)

Sachin Sapatnekar , University of Minnesota
pp. 318-319

CEDA Currents (Abstract)

pp. 322-325
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