The Community for Technology Leaders
Green Image
ABSTRACT
Reports from Workshop on System Effects of Logic Soft Errors (SELSE II), IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop (DDECS 06), European Test Symposium (ETS 06), and International Test Conference (ITC 05).
INDEX TERMS
Logic Soft Errors, conference report
CITATION
C.P. Ravikumar, Mitra Subhasish, Ondrej Novak, Erik Jan Marinissen, Bashir M. Al-Hashimi, Hana Kubatova, "Conference Reports", IEEE Design & Test of Computers, vol. 23, no. , pp. 262-265, July/August 2006, doi:10.1109/MDT.2006.91
89 ms
(Ver 3.1 (10032016))