Issue No. 04 - July/August (2006 vol. 23)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.108
A popular DATE keynote speaker and an award-winning author are among the contributors to this issue, which covers on-chip testing, the sociology of EDA, quiescent-signal analysis, and a survey of test vector compression techniques.
DATE, EDA, quiescent-signal analysis, est vector compression
K. (. Cheng, "Vision from the Top," in IEEE Design & Test of Computers, vol. 23, no. , pp. 261, 2006.