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Issue No. 04 - July/August (2006 vol. 23)
ISSN: 0740-7475
pp: 261
A popular DATE keynote speaker and an award-winning author are among the contributors to this issue, which covers on-chip testing, the sociology of EDA, quiescent-signal analysis, and a survey of test vector compression techniques.
DATE, EDA, quiescent-signal analysis, est vector compression
Kwang-Ting (Tim) Cheng, "Vision from the Top", IEEE Design & Test of Computers, vol. 23, no. , pp. 261, July/August 2006, doi:10.1109/MDT.2006.108
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