The Community for Technology Leaders
Green Image
Issue No. 04 - July/August (2006 vol. 23)
ISSN: 0740-7475
pp: 261
ABSTRACT
A popular DATE keynote speaker and an award-winning author are among the contributors to this issue, which covers on-chip testing, the sociology of EDA, quiescent-signal analysis, and a survey of test vector compression techniques.
INDEX TERMS
DATE, EDA, quiescent-signal analysis, est vector compression
CITATION

K. (. Cheng, "Vision from the Top," in IEEE Design & Test of Computers, vol. 23, no. , pp. 261, 2006.
doi:10.1109/MDT.2006.108
80 ms
(Ver 3.3 (11022016))