Issue No. 03 - May/June (2006 vol. 23)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.81
Bruce C. Kim , University of Alabama
This newsletter provides information on past and upcoming events related to the IEEE Computer Society's Test Technology Technical Council and the test community.
TTTC, test technology, ITC 2005, test technology educational program
B. C. Kim, "Test Technology Technical Council Newsletter," in IEEE Design & Test of Computers, vol. 23, no. , pp. 250, 2006.