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Issue No. 03 - May/June (2006 vol. 23)
ISSN: 0740-7475
pp: 234-243
Vincent Kerz?rho , Philips Semiconductors and LIRMM
Philippe Cauvet , Philips Semiconductors
Editor's note: Testing mixed-signal circuits remains one of the most difficult challenges within the semiconductor industry. In this article, the authors present a novel DFT technique to test sets of ADCs and DACs embedded in a complex SiP. The technique provides fully digital testing on the converters to significantly reduce the cost of testing.
ADC, DAC, mixed-signal testing, DFT, SiP, system-in-package
Vincent Kerz?rho, Serge Bernard, Mariane Comte, Philippe Cauvet, Florence Aza?, Michel Renovell, "A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs", IEEE Design & Test of Computers, vol. 23, no. , pp. 234-243, May/June 2006, doi:10.1109/MDT.2006.59
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