Issue No.03 - May/June (2006 vol.23)
Sachin Sapatnekar , University of Minnesota
Grant Martin , Tensilica
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.66
The 43rd Design Automation Conference presents leading-edge industry practices and academic research across IC, embedded-systems, and "beyond the die" design technologies and methodologies. The authors discuss the highlights, from keynote talks by reknowned personalities in the semiconductor industry to hands-on tutorials.
Design Automation Conference, DAC
Sachin Sapatnekar, Grant Martin, "DAC Highlights", IEEE Design & Test of Computers, vol.23, no. 3, pp. 182-184, May/June 2006, doi:10.1109/MDT.2006.66