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Issue No. 03 - May/June (2006 vol. 23)
ISSN: 0740-7475
pp: 182-184
Sachin Sapatnekar , University of Minnesota
Grant Martin , Tensilica
The 43rd Design Automation Conference presents leading-edge industry practices and academic research across IC, embedded-systems, and "beyond the die" design technologies and methodologies. The authors discuss the highlights, from keynote talks by reknowned personalities in the semiconductor industry to hands-on tutorials.
Design Automation Conference, DAC
Sachin Sapatnekar, Grant Martin, "DAC Highlights", IEEE Design & Test of Computers, vol. 23, no. , pp. 182-184, May/June 2006, doi:10.1109/MDT.2006.66
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