Issue No. 03 - May/June (2006 vol. 23)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.66
Sachin Sapatnekar , University of Minnesota
Grant Martin , Tensilica
The 43rd Design Automation Conference presents leading-edge industry practices and academic research across IC, embedded-systems, and "beyond the die" design technologies and methodologies. The authors discuss the highlights, from keynote talks by reknowned personalities in the semiconductor industry to hands-on tutorials.
Design Automation Conference, DAC
S. Sapatnekar and G. Martin, "DAC Highlights," in IEEE Design & Test of Computers, vol. 23, no. , pp. 182-184, 2006.