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Issue No. 02 - March/April (vol. 23)
ISSN: 0740-7475
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Dealing with Early Life Failures (Abstract)

Kwang-Ting (Tim) Cheng , University of California, Santa Barbara
pp. 85

Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis (Abstract)

Mohd Fairuz Zakaria , Freescale Semiconductor, Malaysia
Zainal Abu Kassim , Freescale Semiconductor, Malaysia
Melanie Po-Leen Ooi , Monash University Malaysia
Serge Demidenko , Monash University Malaysia
pp. 88-98

Combining Negative Binomial and Weibull Distributions for Yield and Reliability Prediction (Abstract)

Thomas S. Barnett , IBM Systems and Technology Group
Matt Grady , IBM Systems and Technology Group
Kathleen G. Purdy , IBM Systems and Technology Group
Adit D. Singh , Auburn University
pp. 110-116
Special Features

Test Consideration for Nanometer-Scale CMOS Circuits (Abstract)

Kaushik Roy , Purdue University
T.M. Mak , Intel
Kwang-Ting (Tim) Cheng , Universityy of California, Santa Barbara
pp. 128-136

A SystemC Refinement Methodology for Embedded Software (Abstract)

J?r? Chevalier , ?cole Polytechnique de Montr?al
Maxime de Nanclas , ?cole Polytechnique de Montr?al
Luc Filion , ?cole Polytechnique de Montr?al
Olivier Benny , ?cole Polytechnique de Montr?al
Mathieu Rondonneau , ?cole Polytechnique de Montr?al
Guy Bois , ?cole Polytechnique de Montr?al
El Mostapha Aboulhamid , University of Montreal
pp. 148-158
Book Reviews

Was it worth the wait? Yes! (HTML)

Brian Bailey , Brian Bailey Consulting
pp. 160-161

An insider's look at microprocessor design (HTML)

Scott Davidson , Sun Microsystems
pp. 162-163

ITC 2005 panels (HTML)

pp. 164-166

TTTC technical forum honoring Sudhakar M. Reddy (HTML)

Sandip Kundu , University of Massachusetts
pp. 167

CEDA Currents (HTML)

Kartikeya Mayaram , Oregon University
pp. 168-171

TTTC Newsletter (HTML)

pp. 175
The Last Byte

Making more out of open-source tools (Abstract)

Burnell West , Credence Systems
pp. 176
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