Issue No. 02 - March/April (2006 vol. 23)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.48
Selahattin Sayil , Lamar University
Editor's note: This article presents a comprehensive review of existing optical contactless probing approaches. Electronic testing publications rarely analyze the topic, despite the fact that contactless probing is becoming more important as fabrication technologies become smaller and more susceptible to the parasitic impact of mechanical probes. The author introduces a new all-silicon optical contactless approach and compares it with previous methods. --Dimitris Gizopoulos, University of Piraeus
testability, error-checking, VLSI, testing tools, error-checking
S. Sayil, "Optical Contactless Probing: An All-Silicon, Fully Optical Approach," in IEEE Design & Test of Computers, vol. 23, no. , pp. 138-146, 2006.