Issue No. 02 - March/April (2006 vol. 23)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.53
John M. Carulli Jr. , Texas Instruments
Thomas J. Anderson , Texas Instruments
Editor's note: A difficulty in reliability modeling is how to capture all of the various reliability defect types. This is a particularly difficult challenge because defect data varies based on fab, technology maturity, and product details. This article describes the framework and models for representing a multitude of reliability defects. --Phil Nigh, IBM Microelectronics
reliability, burn-in, early failure rate, DPPM
T. J. Anderson and J. M. Carulli Jr., "The Impact of Multiple Failure Modes on Estimating Product Field Reliability," in IEEE Design & Test of Computers, vol. 23, no. , pp. 118-126, 2006.