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Issue No. 02 - March/April (2006 vol. 23)
ISSN: 0740-7475
pp: 110-116
Thomas S. Barnett , IBM Systems and Technology Group
Matt Grady , IBM Systems and Technology Group
Kathleen G. Purdy , IBM Systems and Technology Group
Adit D. Singh , Auburn University
Editor's note: It is important to understand the correlation between defects causing yield loss and defects causing reliability failures. This article presents a modeling methodology and supporting data, demonstrating that yield and reliability defects can be directly linked in a unified model. ?Phil Nigh, IBM Microelectronics
reliability, testing, fault tolerance

T. S. Barnett, M. Grady, K. G. Purdy and A. D. Singh, "Combining Negative Binomial and Weibull Distributions for Yield and Reliability Prediction," in IEEE Design & Test of Computers, vol. 23, no. , pp. 110-116, 2006.
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