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Issue No.02 - March/April (2006 vol.23)
pp: 100-109
Ritesh P. Turakhia , Portland State University
W. Robert Daasch , Portland State University
Joel Lurkins , LSI Logic
Brady Benware , LSI Logic
Editor's note: An emerging opportunity is to use statistical analysis of parametric measurements to improve the effectiveness and efficiency of testing and reliability defect stressing. In this article, the authors propose a "statistical testing" framework that combines testing, analysis, and optimization to identify latent-defect signatures --Phil Nigh, IBM Microelectronics
reliability, statistical outlier screening, data modeling, adaptive testing
Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware, "Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers", IEEE Design & Test of Computers, vol.23, no. 2, pp. 100-109, March/April 2006, doi:10.1109/MDT.2006.37
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