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Issue No. 02 - March/April (2006 vol. 23)
ISSN: 0740-7475
pp: 100-109
Brady Benware , LSI Logic
Joel Lurkins , LSI Logic
W. Robert Daasch , Portland State University
Ritesh P. Turakhia , Portland State University
Editor's note: An emerging opportunity is to use statistical analysis of parametric measurements to improve the effectiveness and efficiency of testing and reliability defect stressing. In this article, the authors propose a "statistical testing" framework that combines testing, analysis, and optimization to identify latent-defect signatures --Phil Nigh, IBM Microelectronics
reliability, statistical outlier screening, data modeling, adaptive testing
Brady Benware, Joel Lurkins, W. Robert Daasch, Ritesh P. Turakhia, "Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers", IEEE Design & Test of Computers, vol. 23, no. , pp. 100-109, March/April 2006, doi:10.1109/MDT.2006.37
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