Issue No.02 - March/April (2006 vol.23)
Phil Nigh , IBM Microelectronics
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.41
Guest editor Phil Nigh introduces the Special Issue on Latent-Defect Screening as he explores the difficulties of current methods and calls for new solutions.
latent defects, reliability defects, latent-defect screening, defect acceleration, burn-in, DPPM
Phil Nigh, "Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects", IEEE Design & Test of Computers, vol.23, no. 2, pp. 86-87, March/April 2006, doi:10.1109/MDT.2006.41