Issue No. 02 - March/April (2006 vol. 23)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.41
Phil Nigh , IBM Microelectronics
Guest editor Phil Nigh introduces the Special Issue on Latent-Defect Screening as he explores the difficulties of current methods and calls for new solutions.
latent defects, reliability defects, latent-defect screening, defect acceleration, burn-in, DPPM
P. Nigh, "Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects," in IEEE Design & Test of Computers, vol. 23, no. , pp. 86-87, 2006.