Issue No. 02 - March/April (2006 vol. 23)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.39
Kwang-Ting (Tim) Cheng , University of California, Santa Barbara
<em>D&T</em> editor in chief Tim Cheng discusses the industry's struggle to screen latent defects for complex ICs. He also welcomes two new editors to the <em>D&T</em> editorial board.
latent defects, burn-in, IDDQ, technology scaling, embedded systems
K. (. Cheng, "Dealing with Early Life Failures," in IEEE Design & Test of Computers, vol. 23, no. , pp. 85, 2006.