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TABLE OF CONTENTS
Issue No. 01 - January/February (vol. 23)
ISSN: 0740-7475
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Features

Automated Source-Level Error Localization in Hardware Designs (Abstract)

Bernhard Peischl , Technische Universitat Graz Institute for Software Technology (IST)
Franz Wotawa , Technische Universitat Graz Institute for Software Technology (IST)
pp. 8-19

MOSFET Mismatch Modeling: A New Approach (Abstract)

Hamilton Klimach , Federal University of Rio Grande do Sul
M?rcio C. Schneider , Federal University of Santa Catarina
Carlos Galup-Montoro , Federal University of Santa Catarina
Alfredo Arnaud , Catholic University of Uruguay
pp. 20-29

Logic Design for Printability Using OPC Methods (Abstract)

Karl Wimmer , Freescale Semiconductor
Olivier Toublan , Mentor Graphics Europe
Robert Boone , Freescale Semiconductor
Kevin Lucas , Freescale Semiconductor
Chi-Min Yuan , Freescale Semiconductor
Kirk Strozewski , Freescale Semiconductor
pp. 30-37

Early, Accurate Dependability Analysis of CAN-Based Networked Systems (Abstract)

Massimo Violante , Politecnico di Torino
Matteo Sonza Reorda , Politecnico di Torino
Julio P?rez , Universidad de la Republica, Montevideo, Uruguay
pp. 38-45

Source-Synchronous Testing of Multilane PCI Express and HyperTransport Buses (Abstract)

Dany Minier , IBM Canada
David C. Keezer , Georgia Institute of Technology
Patrice Ducharme , IBM Canada
pp. 46-57

Efficient Parametric Fault Detection in Switched-Capacitor Filters (Abstract)

Jorge M. Ca?ive , Federal University of Rio de Janeiro
Antonio Petraglia , Federal University of Rio de Janeiro
Mariane R. Petraglia , Federal University of Rio de Janeiro
pp. 58-66
Book Reviews

Searching for clues: Diagnosing IC failures (HTML)

Scott Davidson , Sun Microsystems
pp. 67-68

Embedded systems and the kitchen sink (HTML)

Christopher Songer , Stonestreet One
pp. 69-70
Departments

TTTC Newsletter (HTML)

pp. 76-77

DATC Newsletter (HTML)

pp. 78
The Last Byte

All about getting it (Abstract)

Scott Davidson , Sun Microsystems
pp. 80
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