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Issue No.01 - January/February (2006 vol.23)
pp: 20-29
Hamilton Klimach , Federal University of Rio Grande do Sul
Carlos Galup-Montoro , Federal University of Santa Catarina
M?rcio C. Schneider , Federal University of Santa Catarina
Alfredo Arnaud , Catholic University of Uruguay
Editor's note: Handling component mismatch represents a great challenge in analog and even digital design for current and future submicron technologies. This article, a special selection from the Symposium on Integrated Circuits and Systems Design (SBCCI), presents a matching model to help designers account for real effects while maintaining simplicity and easing the design effort.<div>--Luigi Carro, Federal University of Rio Grande do Sul</div>
MOSFET, matching, integrated circuit design, simulation, mismatch compact model
Hamilton Klimach, Carlos Galup-Montoro, M?rcio C. Schneider, Alfredo Arnaud, "MOSFET Mismatch Modeling: A New Approach", IEEE Design & Test of Computers, vol.23, no. 1, pp. 20-29, January/February 2006, doi:10.1109/MDT.2006.20
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