Issue No. 06 - November/December (2005 vol. 22)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2005.146
Robert C. Aitken , ARM
ITC is cool. How can this be, you ask? This is the International Test Conference's 36th year, which makes it a middle-aged conference; and, as anyone who has ever been middle-aged knows, being cool at this time of life is a serious challenge. ITC doesn't try to be cool, at least not in the way that, say, Macworld does. ITC tries instead to be interesting, innovative, and informative. All three of these qualities are vital for a successful conference.
International Test Conference, ITC, high-frequency test, silicon debug, test compression, board and system test
R. C. Aitken, "ITC is Cool," in IEEE Design & Test of Computers, vol. 22, no. , pp. 616, 2005.