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Issue No. 06 - November/December (2005 vol. 22)
ISSN: 0740-7475
pp: 576-584
Xiao Liu , Texas Instruments
Michael S. Hsiao , Virginia Polytechnic Institute and State University
Transition delay tests are crucial to finding ICs with timing defects, but they can also find functionally untestable timing-related faults, thus reducing yield. This article describes an ATPG with constraints that prevent it from using the illegal states that lead to this overtesting.
Hardware I Computing Methodologies

X. Liu and M. S. Hsiao, "A Novel Transition Fault ATPG That Reduces Yield Loss," in IEEE Design & Test of Computers, vol. 22, no. , pp. 576-584, 2005.
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