Issue No.06 - November/December (2005 vol.22)
Xiao Liu , Texas Instruments
Michael S. Hsiao , Virginia Polytechnic Institute and State University
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2005.126
Transition delay tests are crucial to finding ICs with timing defects, but they can also find functionally untestable timing-related faults, thus reducing yield. This article describes an ATPG with constraints that prevent it from using the illegal states that lead to this overtesting.
Hardware I Computing Methodologies
Xiao Liu, Michael S. Hsiao, "A Novel Transition Fault ATPG That Reduces Yield Loss", IEEE Design & Test of Computers, vol.22, no. 6, pp. 576-584, November/December 2005, doi:10.1109/MDT.2005.126