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TABLE OF CONTENTS
Issue No. 04 - July/August (vol. 22)
ISSN: 0740-7475
From the EIC

Nanotechnology: Where science of the small meets math of the large (HTML)

Rajesh Gupta , Editor in Chief, <em>IEEE Design & Test</em>
pp. 289, 294
Special Announcement

IEEE Council for Electronic Design Automation: A new beginning (Abstract)

Al Dunlop , IEEE Council for Electronic Design Automation
Giovanni De Micheli , IEEE Council for Electronic Design Automation
pp. 293-294
Features

Guest Editors' Introduction: Challenges for Reliable Design at the Nanoscale (HTML)

Mehdi B. Tahoori , Northeastern University
Fabrizio Lombardi , Northeastern University
Sandeep K. Shukla , Virginia Tech
R. Iris Bahar , Brown University
pp. 295-297

Recursive TMR: Scaling Fault Tolerance in the Nanoscale Era (Abstract)

Darshan D. Thaker , University of California, Davis
Isaac L. Chuang , Massachusetts Institute of Technology
Rajeevan Amirtharajah , University of California, Davis
Frederic T. Chong , University of California, Santa Barbara
Francois Impens , Massachusetts Institute of Technology
pp. 298-305

Seven Strategies for Tolerating Highly Defective Fabrication (Abstract)

Andr? DeHon , California Institute of Technology
Helia Naeimi , California Institute of Technology
pp. 306-315

A Reconfiguration-Based Defect-Tolerant Design Paradigm for Nanotechnologies (Abstract)

Margarida F. Jacome , University of Texas at Austin
Gustavo de Veciana , University of Texas at Austin
Chen He , University of Texas at Austin and Freescale Semiconductor Inc.
pp. 316-326

Toward Hardware-Redundant, Fault-Tolerant Logic for Nanoelectronics (Abstract)

Pieter Jonker , Delft University of Technology
Jie Han , University of Florida
Jianbo Gao , University of Florida
Yan Qi , Johns Hopkins University
Jos? A.B. Fortes , University of Florida
pp. 328-339
Special Features

New ECC for Crosstalk Impact Minimization (Abstract)

Andr? K. Nieuwland , Philips Research Laboratories
Cecilia Metra , University of Bologna
Atul Katoch , Philips Research Laboratories
Daniele Rossi , University of Bologna
pp. 340-348

Précis: A Usercentric Word-Length Optimization Tool (Abstract)

Scott Hauck , University of Washington
Mark L. Chang , Franklin W. Olin College of Engineering
pp. 349-361

Soft-Spot Analysis: Targeting Compound Noise Effects in Nanometer Circuits (Abstract)

Sujit Dey , University of California, San Diego
Xiaoliang Bai , Cadence Design Systems
Chong Zhao , University of California, San Diego
pp. 362-375

Modeling and Analysis of Parametric Yield under Power and Performance Constraints (Abstract)

Rajeev R. Rao , University of Michigan, Ann Arbor
Anirudh Devgan , Magma Design Automation
David Blaauw , University of Michigan, Ann Arbor
Dennis Sylvester , University of Michigan, Ann Arbor
pp. 376-385
Book Reviews

BIST the hard way (HTML)

Scott Davidson , Sun Microsystems
pp. 386-387
Panel Summaries

Adding value to design and test through education: What are the challenges? (Abstract)

Luigi Carro , Federal University of Rio Grande do Sul
pp. 388, 390
Conference Reports

Conference Reports (Abstract)

pp. 389-390
DATC Newsletter
The Last Byte

What's the problem? (Abstract)

Scott Davidson , Sun Microsystems
pp. 392
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