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Issue No.03 - May/June (vol.22)
ISSN: 0740-7475
From the EIC
Rajesh Gupta , Editor in Chief, <em>IEEE Design & Test</em>
pp. 193
DAC Watch
DAC Highlights (Abstract)
Andrew B. Kahng , University of California, San Diego
Grant Martin , Tensilica
pp. 197-199
The New Face of Design for Manufacturability
Yervant Zorian , Virage Logic
Raul Camposano , Synopsys
Andrzej J. Strojwas , PDF Solutions Inc.
John K. Kibarian , PDF Solutions Inc.
Dennis Wassung , Adams Harkness Inc.
Alex Alexanian , Pont? Solutions Inc.
Steve Wigley , LTX Corp.
Neil Kelly , LTX Corp.
pp. 200-205
Jeng-Liang Tsai , University of Wisconsin-Madison
Dong Hyun Baik , University of Wisconsin-Madison
Charlie Chung-Ping Chen , University of Wisconsin-Madison
Kewal K. Saluja , University of Wisconsin-Madison
pp. 214-222
Jay Jahangiri , Mentor Graphics
David Abercrombie , Mentor Graphics
pp. 224-231
Greg Yeric , HPL Technologies
Ethan Cohen , HPL Technologies
John Garcia , HPL Technologies
Kurt Davis , HPL Technologies
Esam Salem , HPL Technologies
Gary Green , HPL Technologies
pp. 232-239
Special Features
Maher N. Mneimneh , University of Michigan
Karem A. Sakallah , University of Michigan
pp. 248-257
Robert Baumann , Texas Instruments
pp. 258-266
Book Reviews
Sachin Sapatnekar , University of Minnesota
pp. 280-281
Conference Reports
DATC Newsletter
The Last Byte
Gary Smith , Gartner Dataquest
pp. 288
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