The Community for Technology Leaders
Green Image
Issue No. 03 - May/June (vol. 22)
ISSN: 0740-7475
From the EIC

The other face of design for manufacturability (HTML)

Rajesh Gupta , Editor in Chief, <em>IEEE Design & Test</em>
pp. 193
DAC Watch

DAC Highlights (Abstract)

Grant Martin , Tensilica
Andrew B. Kahng , University of California, San Diego
pp. 197-199
The New Face of Design for Manufacturability

Guest Editors' Introduction: DFM Drives Changes in Design Flow (HTML)

Yervant Zorian , Virage Logic
Alex Alexanian , Pont? Solutions Inc.
Dennis Wassung , Adams Harkness Inc.
Andrzej J. Strojwas , PDF Solutions Inc.
John K. Kibarian , PDF Solutions Inc.
Steve Wigley , LTX Corp.
Raul Camposano , Synopsys
Neil Kelly , LTX Corp.
pp. 200-205

Yield-Driven, False-Path-Aware Clock Skew Scheduling (Abstract)

Dong Hyun Baik , University of Wisconsin-Madison
Kewal K. Saluja , University of Wisconsin-Madison
Charlie Chung-Ping Chen , University of Wisconsin-Madison
Jeng-Liang Tsai , University of Wisconsin-Madison
pp. 214-222

Value-Added Defect Testing Techniques (Abstract)

David Abercrombie , Mentor Graphics
Jay Jahangiri , Mentor Graphics
pp. 224-231

Infrastructure for Successful BEOL Yield Ramp, Transfer to Manufacturing, and DFM Characterization at 65 nm and Below (Abstract)

Ethan Cohen , HPL Technologies
Esam Salem , HPL Technologies
Greg Yeric , HPL Technologies
Gary Green , HPL Technologies
Kurt Davis , HPL Technologies
John Garcia , HPL Technologies
pp. 232-239
Special Features

Principles of Sequential-Equivalence Verification (Abstract)

Maher N. Mneimneh , University of Michigan
Karem A. Sakallah , University of Michigan
pp. 248-257

Soft Errors in Advanced Computer Systems (Abstract)

Robert Baumann , Texas Instruments
pp. 258-266
Book Reviews

Empowering the designer (HTML)

Sachin Sapatnekar , University of Minnesota
pp. 280-281
Conference Reports
DATC Newsletter
The Last Byte

Design for manufacturability comes of age (Abstract)

Gary Smith , Gartner Dataquest
pp. 288
96 ms
(Ver 3.1 (10032016))