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Issue No. 03 - May/June (2005 vol. 22)
ISSN: 0740-7475
pp: 224-231
Jay Jahangiri , Mentor Graphics
David Abercrombie , Mentor Graphics
This article describes advanced design-for-manufacturability (DFM) test methods that target defect coverage, yield learning, and cost. The authors argue that testing can be useful for more than filtering chips: It can directly help target test patterns, provide DFM tools, and reduce overall costs.
advanced design-for-manufacturability, DFM test methods, defect testing techniques

D. Abercrombie and J. Jahangiri, "Value-Added Defect Testing Techniques," in IEEE Design & Test of Computers, vol. 22, no. , pp. 224-231, 2005.
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