Issue No. 03 - May/June (2005 vol. 22)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2005.74
David Abercrombie , Mentor Graphics
Jay Jahangiri , Mentor Graphics
This article describes advanced design-for-manufacturability (DFM) test methods that target defect coverage, yield learning, and cost. The authors argue that testing can be useful for more than filtering chips: It can directly help target test patterns, provide DFM tools, and reduce overall costs.
advanced design-for-manufacturability, DFM test methods, defect testing techniques
David Abercrombie, Jay Jahangiri, "Value-Added Defect Testing Techniques", IEEE Design & Test of Computers, vol. 22, no. , pp. 224-231, May/June 2005, doi:10.1109/MDT.2005.74