Issue No. 03 - May/June (2005 vol. 22)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2005.61
Yervant Zorian , Virage Logic
Alex Alexanian , Pont? Solutions Inc.
Dennis Wassung , Adams Harkness Inc.
Andrzej J. Strojwas , PDF Solutions Inc.
John K. Kibarian , PDF Solutions Inc.
Steve Wigley , LTX Corp.
Raul Camposano , Synopsys
Juan-Antonio Carballo , IBM Corp.
Neil Kelly , LTX Corp.
Design for manufacturability (DFM) has thus far been the focus of extensive study in the semiconductor industry. Although deep-submicron processes enable the manufacture of area-efficient, high-performance chips, navigating the nanometer landscape presents enormous manufacturability challenges.
Design for manufacturability, DFM
Yervant Zorian, Alex Alexanian, Dennis Wassung, Andrzej J. Strojwas, John K. Kibarian, Steve Wigley, Raul Camposano, Juan-Antonio Carballo, Neil Kelly, "Guest Editors' Introduction: DFM Drives Changes in Design Flow", IEEE Design & Test of Computers, vol. 22, no. , pp. 200-205, May/June 2005, doi:10.1109/MDT.2005.61