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Issue No. 03 - May/June (2005 vol. 22)
ISSN: 0740-7475
pp: 200-205
Yervant Zorian , Virage Logic
Alex Alexanian , Pont? Solutions Inc.
Dennis Wassung , Adams Harkness Inc.
Andrzej J. Strojwas , PDF Solutions Inc.
John K. Kibarian , PDF Solutions Inc.
Steve Wigley , LTX Corp.
Raul Camposano , Synopsys
Neil Kelly , LTX Corp.
ABSTRACT
Design for manufacturability (DFM) has thus far been the focus of extensive study in the semiconductor industry. Although deep-submicron processes enable the manufacture of area-efficient, high-performance chips, navigating the nanometer landscape presents enormous manufacturability challenges.
INDEX TERMS
Design for manufacturability, DFM
CITATION
Yervant Zorian, Alex Alexanian, Dennis Wassung, Andrzej J. Strojwas, John K. Kibarian, Steve Wigley, Raul Camposano, Juan-Antonio Carballo, Neil Kelly, "Guest Editors' Introduction: DFM Drives Changes in Design Flow", IEEE Design & Test of Computers, vol. 22, no. , pp. 200-205, May/June 2005, doi:10.1109/MDT.2005.61
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