Issue No. 02 - March/April (2005 vol. 22)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2005.49
Ming Shae Wu , National Chiao Tung University
Chung Len Lee , National Chiao Tung University
This BIST scheme simplifies the detection of crosstalk faults in deep-submicron VLSI circuits in the boundary scan environment. Simulation results show that with just a few random patterns, fault coverage for most large benchmark circuits can exceed 90%.
C. L. Lee and M. S. Wu, "Using a Periodic Square Wave Test Signal to Detect Crosstalk Faults," in IEEE Design & Test of Computers, vol. 22, no. , pp. 160-169, 2005.