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Issue No.02 - March/April (2005 vol.22)
pp: 160-169
Ming Shae Wu , National Chiao Tung University
Chung Len Lee , National Chiao Tung University
This BIST scheme simplifies the detection of crosstalk faults in deep-submicron VLSI circuits in the boundary scan environment. Simulation results show that with just a few random patterns, fault coverage for most large benchmark circuits can exceed 90%.
Ming Shae Wu, Chung Len Lee, "Using a Periodic Square Wave Test Signal to Detect Crosstalk Faults", IEEE Design & Test of Computers, vol.22, no. 2, pp. 160-169, March/April 2005, doi:10.1109/MDT.2005.49
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