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Issue No. 02 - March/April (2005 vol. 22)
ISSN: 0740-7475
pp: 160-169
Ming Shae Wu , National Chiao Tung University
Chung Len Lee , National Chiao Tung University
This BIST scheme simplifies the detection of crosstalk faults in deep-submicron VLSI circuits in the boundary scan environment. Simulation results show that with just a few random patterns, fault coverage for most large benchmark circuits can exceed 90%.

C. L. Lee and M. S. Wu, "Using a Periodic Square Wave Test Signal to Detect Crosstalk Faults," in IEEE Design & Test of Computers, vol. 22, no. , pp. 160-169, 2005.
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