The Community for Technology Leaders
Green Image
Issue No. 01 - January/February (2005 vol. 22)
ISSN: 0740-7475
pp: 80
Scott Davidson , Sun Microsystems
INDEX TERMS
CITATION

S. Davidson, "Testing: It's not just pass/fail anymore," in IEEE Design & Test of Computers, vol. 22, no. , pp. 80, 2005.
doi:10.1109/MDT.2005.22
97 ms
(Ver 3.3 (11022016))