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Issue No. 01 - January/February (2005 vol. 22)
ISSN: 0740-7475
pp: 80
Scott Davidson , Sun Microsystems
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CITATION
Scott Davidson, "Testing: It's not just pass/fail anymore", IEEE Design & Test of Computers, vol. 22, no. , pp. 80, January/February 2005, doi:10.1109/MDT.2005.22
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