Issue No. 06 - November/December (2004 vol. 21)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2004.96
Fr?d?ric Worm , Swiss Federal Institute of Technology Lausanne
Paolo Ienne , Swiss Federal Institute of Technology Lausanne
Patrick Thiran , Swiss Federal Institute of Technology Lausanne
Giovanni De Micheli , Stanford University
<it>Editor's note:</it> Dynamic self-calibration holds the promise of overcoming conservative worst-case design techniques needed to combat deep-submicron process and operating variations. This article proposes an on-chip point-to-point interconnect scheme characterized by self-calibration that can operate dynamically to achieve the best energy/performance trade-off. <it>—Soha Hassoun, Tufts University</it>
G. D. Micheli, P. Ienne, F. Worm and P. Thiran, "On-Chip Self-Calibrating Communication Techniques Robust to Electrical Parameter Variations," in IEEE Design & Test of Computers, vol. 21, no. , pp. 524-535, 2004.