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Issue No. 06 - November/December (2004 vol. 21)
ISSN: 0740-7475
pp: 524-535
Giovanni De Micheli , Stanford University
Paolo Ienne , Swiss Federal Institute of Technology Lausanne
Fr?d?ric Worm , Swiss Federal Institute of Technology Lausanne
Patrick Thiran , Swiss Federal Institute of Technology Lausanne
<it>Editor's note:</it> Dynamic self-calibration holds the promise of overcoming conservative worst-case design techniques needed to combat deep-submicron process and operating variations. This article proposes an on-chip point-to-point interconnect scheme characterized by self-calibration that can operate dynamically to achieve the best energy/performance trade-off. <it>—Soha Hassoun, Tufts University</it>
Giovanni De Micheli, Paolo Ienne, Fr?d?ric Worm, Patrick Thiran, "On-Chip Self-Calibrating Communication Techniques Robust to Electrical Parameter Variations", IEEE Design & Test of Computers, vol. 21, no. , pp. 524-535, November/December 2004, doi:10.1109/MDT.2004.96
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