, Sun Microsystems
Pages: pp. 448-449
If you are implementing an automatic test pattern generator, or want to know why they work the way they do, this is the book for you. A lot of hard-won practical knowledge is included here. However, the reader should check the references to see which techniques are recent and which come from the distant past (18 years ago, in this case). This is not to say that a historical view is bad; perhaps this book can keep someone from reinventing an old test technique, which would be a good thing indeed.