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TABLE OF CONTENTS
Issue No. 04 - July/August (vol. 21)
ISSN: 0740-7475
EIC Message

Manufacturing test woes (HTML)

Rajesh Gupta , Editor in Chief, <em>IEEE Design & Test</em>
pp. 269-270
Features

Looking back, looking around (Abstract)

Sumit DasGupta , Silicon Integration Initiative
pp. 271-273

Guest Editors' Introduction: Advances in VLSI Testing at MultiGbps Rates (HTML)

Fabrizio Lombardi , Northeastern University
Cecilia Metra , University of Bologna
Andr? Ivanov , University of British Columbia
pp. 274-276

Multiplexing ATE Channels for Production Testing at 2.5 Gbps (Abstract)

David C. Keezer , Georgia Institute of Technology
Dany Minier , IBM Canada
pp. 288-301

Jitter Models for the Design and Test of Gbps-Speed Serial Interconnects (Abstract)

Touraj Farahmand , University of British Columbia
Andy Kuo , University of British Columbia
Andr? Ivanov , University of British Columbia
Sassan Tabatabaei , University of British Columbia
Nelson Ou , University of British Columbia
pp. 302-313
Special Features

A Built-In Parametric Timing Measurement Unit (Abstract)

Ming-Jun Hsiao , National Tsing Hua University
Tsin-Yuan Chang , National Tsing Hua University
Jing-Reng Huang , National Tsing Hua University
pp. 322-330
Departments

Conference Reports (Abstract)

pp. 339-341

Panel Summaries (Abstract)

Ajay Khoche , Agilent Technologies
pp. 342

Test at Gbps: Megaproblem or micromanagement? (Abstract)

Rob Aitken , Artisan Components
pp. 344
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