Issue No. 04 - July/August (2004 vol. 21)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2004.34
Nelson Ou , University of British Columbia
Touraj Farahmand , University of British Columbia
Andy Kuo , University of British Columbia
Sassan Tabatabaei , University of British Columbia
Andr? Ivanov , University of British Columbia
Gigabit data rates in high-speed interconnects require careful modeling of jitter and its effect on the bit error rates. This article presents a comprehensive analysis of jitter causes and types, and develops accurate jitter models for design and test of high-speed interconnects.
T. Farahmand, A. Kuo, A. Ivanov, S. Tabatabaei and N. Ou, "Jitter Models for the Design and Test of Gbps-Speed Serial Interconnects," in IEEE Design & Test of Computers, vol. 21, no. , pp. 302-313, 2004.