Issue No.04 - July/August (2004 vol.21)
David C. Keezer , Georgia Institute of Technology
Dany Minier , IBM Canada
Marie-Christine Caron , IBM Canada
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2004.37
For industry, volume-production-stage testing of multigigahertz ICs poses economic challenges that are at least as significant as the associated technical challenges. Here, the authors address both issues by describing a practical solution based on the retrofit of conventional ATE resources to allow accurate testing of ICs with many channels. Their system can test ICs at 2.5 Gbps over 144 channels, with extensions planned that will have test rates exceeding 5 Gbps.
David C. Keezer, Dany Minier, Marie-Christine Caron, "Multiplexing ATE Channels for Production Testing at 2.5 Gbps", IEEE Design & Test of Computers, vol.21, no. 4, pp. 288-301, July/August 2004, doi:10.1109/MDT.2004.37