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Issue No. 04 - July/August (2004 vol. 21)
ISSN: 0740-7475
pp: 278-286
T.M. Mak , Intel
Mike Tripp , Intel
Anne Meixner , Intel
ABSTRACT
These authors from Intel provide evidence for the rapid deployment of ICs equipped with high-speed serial interfaces. They argue that this constitutes a revolutionary functional and design paradigm shift, which in turn dictates a corresponding shift in test and DFT methods. They also review various approaches and discuss the tradeoffs they experienced in testing actual devices.
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CITATION

A. Meixner, M. Tripp and T. Mak, "Testing Gbps Interfaces without a Gigahertz Tester," in IEEE Design & Test of Computers, vol. 21, no. , pp. 278-286, 2004.
doi:10.1109/MDT.2004.42
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