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Issue No. 04 - July/August (2004 vol. 21)
ISSN: 0740-7475
pp: 274-276
Andr? Ivanov , University of British Columbia
Fabrizio Lombardi , Northeastern University
Cecilia Metra , University of Bologna
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CITATION

F. Lombardi, C. Metra and A. Ivanov, "Guest Editors' Introduction: Advances in VLSI Testing at MultiGbps Rates," in IEEE Design & Test of Computers, vol. 21, no. , pp. 274-276, 2004.
doi:10.1109/MDT.2004.31
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