The Community for Technology Leaders
Green Image
Issue No. 03 - May/June (2004 vol. 21)
ISSN: 0740-7475
pp: 177-182
Yervant Zorian , Virage Logic
Dimitris Gizopoulos , University of Piraeus
Cary Vandenberg , HPL Technologies
Philippe Magarshack , STMicroelectronics
INDEX TERMS
CITATION
Yervant Zorian, Dimitris Gizopoulos, Cary Vandenberg, Philippe Magarshack, "Guest Editors' Introduction: Design for Yield and Reliability", IEEE Design & Test of Computers, vol. 21, no. , pp. 177-182, May/June 2004, doi:10.1109/MDT.2004.12
83 ms
(Ver 3.3 (11022016))