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Issue No. 03 - May/June (2004 vol. 21)
ISSN: 0740-7475
pp: 177-182
Philippe Magarshack , STMicroelectronics
Dimitris Gizopoulos , University of Piraeus
Yervant Zorian , Virage Logic
Cary Vandenberg , HPL Technologies
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CITATION
Philippe Magarshack, Dimitris Gizopoulos, Yervant Zorian, Cary Vandenberg, "Guest Editors' Introduction: Design for Yield and Reliability", IEEE Design & Test of Computers, vol. 21, no. , pp. 177-182, May/June 2004, doi:10.1109/MDT.2004.12
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