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Issue No. 02 - March/April (vol. 21)
ISSN: 0740-7475
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Past successes, future challenges (HTML)

Rajesh Gupta , Editor in Chief, <em>IEEE Design & Test</em>
pp. 77-78

Guest Editors' Introduction: The Verification and Test of Complex Digital ICs (HTML)

Magdy S. Abadir , Motorola
Li-C. Wang , University of California, Santa Barbara
pp. 80-82

Genesys-Pro: Innovations in Test Program Generation for Functional Processor Verification (Abstract)

Allon Adir , IBM Research Lab, Haifa
Eli Almog , IBM Research Lab, Haifa
Laurent Fournier , IBM Research Lab, Haifa
Eitan Marcus , IBM Research Lab, Haifa
Michal Rimon , IBM Research Lab, Haifa
Michael Vinov , IBM Research Lab, Haifa
Avi Ziv , IBM Research Lab, Haifa
pp. 84-93

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pp. C4

A Top-Down Methodology for Microprocessor Validation (Abstract)

Prabhat Mishra , University of California, Irvine
Nikil Dutt , University of California, Irvine
Magdy S. Abadir , Motorola
pp. 122-131

Safety Property Verification Using Sequential SAT and Bounded Model Checking (Abstract)

Ganapathy Parthasarathy , University of California, Santa Barbara
Madhu K. Iyer , University of California, Santa Barbara
Kwang-Ting (Tim) Cheng , University of California, Santa Barbara
Li-C. Wang , University of California, Santa Barbara
pp. 132-143

ITC 2003 Roundtable: Design for Manufacturability (Abstract)

Rob Aitken , Artisan Components
Stefan Eichenberger , Philips Semiconductors
Sandip Kundu , Intel
Hank Walker , Texas A&M University
pp. 144-156

Policies and procedures--who needs them? (Abstract)

Peter J. Ashenden , Ashenden Designs
pp. 157-158
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